Giulio
Giulio Borghello is a member of the CERN Microelectronics Section since 2016. His work involves evaluating the radiation response of CMOS technologies used in ASICs developed in the Microelectronics Section. He received his PhD in electronics engineering in 2019 from the University of Udine with a thesis entitled "Ionizing radiation effects in nanoscale CMOS technologies exposed to ultra-high doses". He has authored and co-authored 17 journal and conference papers on the topic of radiation effects in modern CMOS technologies.